Analysis of white-light interferograms by using Stockwell transform


Sarac Z.

OPTICS AND LASERS IN ENGINEERING, cilt.46, ss.823-828, 2008 (SCI İndekslerine Giren Dergi)

  • Cilt numarası: 46 Konu: 11
  • Basım Tarihi: 2008
  • Doi Numarası: 10.1016/j.optlaseng.2008.05.017
  • Dergi Adı: OPTICS AND LASERS IN ENGINEERING
  • Sayfa Sayısı: ss.823-828

Özet

This paper proposes the use of Stockwell transform for the analysis of white-light interferograms. The performance of Stockwell transform is assessed from the statistical parameters obtained by analyzing the simulated and experimental interferograms. Furthermore, the sensitivity of Stockwell transform to intensity and the phase noises is investigated. Results show that sampling and intensity noises significantly affect the performance of Stockwell transform. (C) 2008 Elsevier Ltd. All rights reserved.