Schottky barrier diode parameters of Ag/MgPc/p-Si structure


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CANLICA M., COŞKUN M. , ALTINDAL A., Nyokong T.

JOURNAL OF PORPHYRINS AND PHTHALOCYANINES, cilt.16, ss.855-860, 2012 (SCI İndekslerine Giren Dergi)

  • Cilt numarası: 16
  • Basım Tarihi: 2012
  • Doi Numarası: 10.1142/s1088424612500824
  • Dergi Adı: JOURNAL OF PORPHYRINS AND PHTHALOCYANINES
  • Sayfa Sayısı: ss.855-860

Özet

An Ag/Pc/p-Si Schottky barrier (SB) diode was fabricated. The current-voltage (I-V), capacitance-voltage (C-V) and conductance-voltage (G-V) measurements were carried out to determine the characteristic parameters such as barrier height, ideality factor and series resistance of the SB diode. The non-linear behavior of ln (I) vs. ln (V) and ln (I/V) vs. V-1/2 plots indicated that the thermoionic emission theory can be applied to evaluate junction parameters for the investigated SB diode rather than space-charge limited conduction (SCLC) mechanism and bulk-limited Poole-Frenkel emission. The bulk doping concentration N-B and fixed oxide charges N-f was determined from the measured high frequency C-V curve and was found to be 9.5 x 10(14) cm(-3) and 2.3 x 10(13) cm(-2), respectively. The values of barrier height obtained from Norde's function were compared with those from the forward bias current-voltage characteristic, and it was seen that there was a good agreement between barrier heights from both methods.