APL MATERIALS, cilt.1, 2013 (SCI İndekslerine Giren Dergi)
We report a novel perpendicularly magnetized thin film [Co91.5Ta4.5Zr4/Pd](5) multilayer, which exhibits strong perpendicular magnetic anisotropy when grown on 5 nm of Pd and Ru seed layers. The Pd-seeded multilayer annealed at 300 degrees C shows an effective uniaxial anisotropy constant, K-eff = 1.1 MJ m(-3), with an anisotropy field as high as 1.6 T. The perpendicular anisotropy is sustained on annealing at 400 degrees C for 1 h. X-ray diffraction on multilayers with 30 repeats suggests that the use of amorphous CoTaZr reduces the stress of the stack, compared to [Co/Pd] multilayer. (C) 2013 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.