JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol.41, no.13, 2008 (Peer-Reviewed Journal)
We have studied electrical parameters of an Al/methyl violet/p-Si Schottky device by using current-voltage and capacitance-voltage-frequency measurements under gamma irradiation at room temperature. Experimental results have shown that gamma radiation gives rise to an increase in the barrier height, the ideality factor and the interfacial state density, while the series resistance decreases by applied radiation.