An investigation of I-V characteristics of Au/n-GaAs Schottky diodes after hydrostatic pressure

Çankaya G., Uçar N., TÜRÜT A.

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, vol.179, no.2, pp.469-473, 2000 (Peer-Reviewed Journal) identifier

  • Publication Type: Article / Article
  • Volume: 179 Issue: 2
  • Publication Date: 2000
  • Journal Indexes: Science Citation Index Expanded
  • Page Numbers: pp.469-473


The experimental results have shown that the I-V characteristics of the diode shift to lower current values due to an increase of the Schottky barrier height with increasing hydrostatic pressure and the quality of the diode improves. It has been seen that the I-V characteristics after removal of the hydrostatic pressure have coincided with that at 1 kbar. Furthermore, the time-dependence of I-V characteristics of the Au/n-GaAs Schottky diodes 15, 30 and 45 days after the pressure has been removed have also coincided with that at 1 kbar. After the pressure treatments, this behavior of our diodes has been ascribed to the removal of fabrication-induced lateral inhomogeneities of the barrier height.