TÜRÜT, A. Et Al. 2015. The interface state density characterization by temperature-dependent capacitance-conductance-frequency measurements in Au/Ni/n-GaN structures. MATERIALS RESEARCH EXPRESS , vol.2, no.9 .

TÜRÜT, A., Dogan, H., & Yildirim, N., (2015). The interface state density characterization by temperature-dependent capacitance-conductance-frequency measurements in Au/Ni/n-GaN structures. MATERIALS RESEARCH EXPRESS , vol.2, no.9.

TÜRÜT, ABDULMECİT, H. Dogan, And N. Yildirim. "The interface state density characterization by temperature-dependent capacitance-conductance-frequency measurements in Au/Ni/n-GaN structures," MATERIALS RESEARCH EXPRESS , vol.2, no.9, 2015

TÜRÜT, ABDULMECİT Et Al. "The interface state density characterization by temperature-dependent capacitance-conductance-frequency measurements in Au/Ni/n-GaN structures." MATERIALS RESEARCH EXPRESS , vol.2, no.9, 2015

TÜRÜT, A. Dogan, H. And Yildirim, N. (2015) . "The interface state density characterization by temperature-dependent capacitance-conductance-frequency measurements in Au/Ni/n-GaN structures." MATERIALS RESEARCH EXPRESS , vol.2, no.9.

@article{article, author={ABDULMECİT TÜRÜT Et Al. }, title={The interface state density characterization by temperature-dependent capacitance-conductance-frequency measurements in Au/Ni/n-GaN structures}, journal={MATERIALS RESEARCH EXPRESS}, year=2015}